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一种基于集成器件的光谱检测装置及方法

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Affilication of Author(s):电气与电子工程学院

Teaching and Research Group:电气与电子工程学院

Scope of patent:国内

School Sign:第一单位

Type of Patent:发明专利

State of Patent:专利授权

Application Number:201611029407.2

Authorization number:ZL201611029407.2

Number of Inventors:2

Service Invention or Not:no

Application Date:2016-11-14

Authorization Date:2018-03-23